Questions
1
The relationship between minimum wavelength of X-radiation generated from a target metal and applied voltage is given by
Answer:Duane-Hunt equation
2
As the applied voltage increases, the minimum wavelength of X-radiation from a metal
Answer:Decreases
4
In goniometer, if analyzing crystal rotates at angle of 30 o, the detector should rotate at an angle of
Answer:60°
5
As the atomic number increases, the frequency of X-radiation from a target material
Answer:Increases
6
If the atomic number of copper and molybdenum are 29 and 42 respectively, longer wavelengths of K a line is produced by
Answer:Copper
7
In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _________ of lines and their relative ___________
Answer:Position, intensity
8
Diffractometers are similar to which of the following?
Answer:Optical grating spectrometer
9
In Diffractometers, line intensities depend on ______ and kind of atomic reflection centres in each set of plates.
Answer:Number
10
In powder diffractometer, the sharpness of the lines is greatly determined by which of the following?
Answer:Quality of the slit, size of the sample
