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Free download in PDF X-Ray Diffraction Multiple Choice Questions and Answers for competitive exams. These short objective type questions with answers are very important for Board exams as well as competitive exams like UPSC, NDA, SSC etc. These short solved questions or quizzes are provided by Gkseries./p>
(1)
The relationship between minimum wavelength of X-radiation generated from a target metal and applied voltage is given by
[A]
Bragg’s equation
[B]
Moseley equation
[C]
Illkovik equation
[D]
Duane-Hunt equation
Answer: Duane-Hunt equation
(2)
As the applied voltage increases, the minimum wavelength of X-radiation from a metal
[A]
Increases
[B]
Decreases
[C]
Remains same
[D]
Variable with metal
(3)
Which of the following has long wavelength
[A]
Kα1
[B]
Kβ1
[C]
Kα2
[D]
Kβ2
Answer: None of the above
(4)
In goniometer, if analyzing crystal rotates at angle of 30 o, the detector should rotate at an angle of
[A]
15°
[B]
30°
[C]
45°
[D]
60°
(5)
As the atomic number increases, the frequency of X-radiation from a target material
[A]
Increases
[B]
Decreases
[C]
Remains same
[D]
Variable with metal
(6)
If the atomic number of copper and molybdenum are 29 and 42 respectively, longer wavelengths of K a line is produced by
[A]
Copper
[B]
Molybdenum
[C]
Both
[D]
None
(7)
In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _________ of lines and their relative ___________
[A]
Number, length
[B]
Number, intensity
[C]
Position, length
[D]
Position, intensity
Answer: Position, intensity
(8)
Diffractometers are similar to which of the following?
[A]
Optical grating spectrometer
[B]
Prism spectrometer
[C]
Photo multiplier
[D]
Photovoltaic cell
Answer: Optical grating spectrometer
(9)
In Diffractometers, line intensities depend on ______ and kind of atomic reflection centres in each set of plates.
[A]
Number
[B]
Position
[C]
Length
[D]
Distance between lines
(10)
In powder diffractometer, the sharpness of the lines is greatly determined by which of the following?
[A]
Quality of the sample, size of the slit
[B]
Quality of the slit, size of the sample
[C]
Thickness of the slit, amount of the sample
[D]
Number of slits, composition of the sample
Answer: Quality of the slit, size of the sample
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